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Applied Optics

Applied Optics


  • Vol. 28, Iss. 6 — Mar. 15, 1989
  • pp: 1052–1054

Calculation of the Bragg angle for synthetic multilayer x-ray reflectors

Kenneth D. Shaw and Allen S. Krieger  »View Author Affiliations

Applied Optics, Vol. 28, Issue 6, pp. 1052-1054 (1989)

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An expression is derived for the Bragg angle of synthetic multilayer x-ray reflectors. It displays the explicit dependences on not only the wavelength of the radiation and the period of the multilayer, but also on the ratio of the thicknesses of the two layers comprising one period. Absorptive dependence is also taken into account.

© 1989 Optical Society of America

Original Manuscript: June 23, 1988
Published: March 15, 1989

Kenneth D. Shaw and Allen S. Krieger, "Calculation of the Bragg angle for synthetic multilayer x-ray reflectors," Appl. Opt. 28, 1052-1054 (1989)

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  1. B. L. Henke, J. Y. Uejio, H. T. Yamada, R. E. Tackaberry, “Characterization of Multilayer X-Ray Analyzers: Models and Measurements,” Opt. Eng. 25, 937 (1986). [CrossRef]
  2. J. H. Underwood, T. W. Barbee, “Synthetic Multilayers as Bragg Diffractors for X-rays and Extreme Ultraviolet: Calculations of Performance,” AIP Conf. Proc. 75, 170 (1981). [CrossRef]
  3. T. W. Barbee, “Multilayers for X-Ray Optics,” Opt. Eng. 25, 898 (1986).
  4. A. H. Compton, S. K. Allison, X-Rays in Theory and Experiment (Van Nostrand, New York, 1935), p. 674.
  5. T. W. Barbee, “Sputtered Layered Synthetic Microstructure (LSM) Dispersion Elements,” AIP Conf. Proc. 75, 131 (1981). [CrossRef]
  6. A. E. Rosenbluth, J. M. Forsyth, “The Reflecting Properties of Soft X-ray Multilayers,” AIP Conf. Proc. 75, 280 (1981). [CrossRef]

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