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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 6 — Mar. 15, 1989
  • pp: 1165–1168

Spatial filtering by a line-scanned nonrectangular detector: application to SPRITE readout MTF

Glenn D. Boreman and Allen E. Plogstedt  »View Author Affiliations


Applied Optics, Vol. 28, Issue 6, pp. 1165-1168 (1989)
http://dx.doi.org/10.1364/AO.28.001165


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Abstract

Any finite-sized photodetector has an effect on the spatial frequency content of the detected image. An expression for the modulation transfer function (MTF) of a nonrectangular detector in the along-scan direction is obtained. A comparison of our theoretical prediction is made with published experimental and numerical values for the MTF of a photosite having an exponentially tapered shape. Structures of this form are used as the readout region in SPRITE (signal processing in the element) detectors.

© 1989 Optical Society of America

History
Original Manuscript: July 6, 1988
Published: March 15, 1989

Citation
Glenn D. Boreman and Allen E. Plogstedt, "Spatial filtering by a line-scanned nonrectangular detector: application to SPRITE readout MTF," Appl. Opt. 28, 1165-1168 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-6-1165


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References

  1. C. T. Elliott, “New Detector for Thermal Imaging Systems,” Electron. Lett. 17, 312 (1981). [CrossRef]
  2. C. T. Elliott, D. Day, D. J. Wilson, “An Integrating Detector for Serial Scan Thermal Imaging,” Infrared Phys. 22, 31 (1982). [CrossRef]
  3. A. Blackburn, M. V. Blackman, D. E. Charlton, W. A. E. Dunn, M. D. Jenner, K. J. Oliver, J. T. M. Wotherspoon, “The Practical Realization and Performance of SPRITE Detectors,” Infrared Phys. 22, 57 (1982). [CrossRef]
  4. D. J. Day, T. J. Shepherd, “Transport in Photo-Conductors—I,” Solid State Electron. 25, 707 (1982). [CrossRef]
  5. G. Boreman, A. Plogstedt, “Modulation Transfer Function and Number of Equivalent Elements for SPRITE Detectors,” Appl. Opt. 27, 4331 (1988). [CrossRef] [PubMed]
  6. T. Ashley, C. T. Elliott, A. M. White, J. T. M. Wotherspoon, M. D. Johns, “Optimization of Spatial Resolution in SPRITE Detectors,” Infrared Phys. 24, 25 (1984). [CrossRef]
  7. J. M. Lloyd, Thermal Imaging Systems (Plenum, New York, 1975), Chap. 9.
  8. L. G. Callahan, W. M. Brown, “One- and Two-Dimensional Processing in Line Scanning Systems,” Appl. Opt. 2, 401 (1963). [CrossRef]
  9. A. Papoulis, Systems and Transforms with Applications in Optics (McGraw-Hill, New York, 1968), pp. 95–96.
  10. J. D. Gaskill, Linear Systems, Fourier Transforms and Optics (Wiley, New York, 1978), pp. 311–312.
  11. S. P. Braim, A. P. Campbell, “TED (SPRITE) Detector MTF,” in Proceedings of the Conference on Advanced IR Detectors and Systems (IEE, London, 1983), Vol. 228, p. 63.

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