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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 6 — Mar. 15, 1989
  • pp: 1214–1220

Optical spatial intensity profiles for high order autocorrelation in fluorescence spectroscopy

Arthur G. Palmer, III and Nancy L. Thompson  »View Author Affiliations


Applied Optics, Vol. 28, Issue 6, pp. 1214-1220 (1989)
http://dx.doi.org/10.1364/AO.28.001214


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Abstract

Interpretation of spatially resolved optical spectroscopies requires knowledge of the optical excitation and collection profiles of the experimental apparatus. This paper describes measurement of the relative norms of the spatial profile of a microscope- and laser-based optical system. The profile is given by the product of the spatial intensity of a focused laser beam and the point collection efficiency of the microscope. Experimental determination of the values of the norms is essential to the use of high order autocorrelation in fluorescence correlation spectroscopy to measure the concentrations and relative fluorescence yields of different fluorescent components (e.g., monomers and oligomers) in a multicomponent solution and also permits evaluation of theoretical models of the optical spatial intensity profile. In addition, the results may have applicability to high order autocorrelation in other optical spectroscopies, to confocal microscopy and to nonlinear optics in general.

© 1989 Optical Society of America

History
Original Manuscript: October 10, 1988
Published: March 15, 1989

Citation
Arthur G. Palmer and Nancy L. Thompson, "Optical spatial intensity profiles for high order autocorrelation in fluorescence spectroscopy," Appl. Opt. 28, 1214-1220 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-6-1214

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