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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 6 — Mar. 15, 1989
  • pp: 1231–1234

Fringe pattern analysis in low-quality interferograms

Luca Crescentini  »View Author Affiliations


Applied Optics, Vol. 28, Issue 6, pp. 1231-1234 (1989)
http://dx.doi.org/10.1364/AO.28.001231


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Abstract

Mechanical vibrations in the frame of an interferometer can introduce a space-dependent factor throughout an interferogram, making its analysis quite difficult. This factor is formally equivalent to the modulus of the complex degree of coherence in the case of quasimonochromatic light. A simple method for retrieving the underlying phase distribution and detecting small perturbations is presented. Introducing an appropriate correction for the above-mentioned factor, good sensitivity is also achievable in noisy environments.

© 1989 Optical Society of America

History
Original Manuscript: March 3, 1988
Published: March 15, 1989

Citation
Luca Crescentini, "Fringe pattern analysis in low-quality interferograms," Appl. Opt. 28, 1231-1234 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-6-1231

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