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Applied Optics

Applied Optics


  • Vol. 28, Iss. 7 — Apr. 1, 1989
  • pp: 1360–1364

Optical scattering from oxidized metals. 1: Model formulation and properties

Arne Roos, Mikael Bergkvist, and Carl-Gustaf Ribbing  »View Author Affiliations

Applied Optics, Vol. 28, Issue 7, pp. 1360-1364 (1989)

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Strong scattering, which exhibits a conspicuous wavelength dependence, has been experimentally observed from certain oxidized metals. A model is presented which combines the effects of interface illumination in a new normalization procedure with the scalar scattering reduction of the Fresnel interface reflectance coefficients. The model is used to calculate the specular and the diffuse part of the hemispheric reflectance from the double layer, with oxide thickness and rms roughness as input parameters. The results give a qualitatively correct spectral variation and underline the importance of the substrate reflectance. The results also illustrate an interesting difference in scattering behavior, whether the front surface or the oxide–metal interface is rough.

© 1989 Optical Society of America

Original Manuscript: August 17, 1988
Published: April 1, 1989

Arne Roos, Mikael Bergkvist, and Carl-Gustaf Ribbing, "Optical scattering from oxidized metals. 1: Model formulation and properties," Appl. Opt. 28, 1360-1364 (1989)

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  1. J. M. Eastman, “Scattering by All-Dielectric Multilayer Bandpass Filters and Mirrors, for Lasers,” Phys. Thin Films 10, 167 (1978).
  2. C. K. Carniglia, “Scalar Scattering Theory for Multilayer Optical Coatings,” Opt. Eng. 18, 104 (1979). [CrossRef]
  3. P. Roche, C. Amra, E. Pelletier, “Measurement of Scattering Distribution for Characterization of the Roughness of Coated or Uncoated Substrates,” Proc. Soc. Photo-Opt. Instrum. Eng. 652, 256 (1986).
  4. A. Roos, M. Bergkvist, C-G. Ribbing, “Observation of Diffuse Interference in Reflectance from Oxide-Coated Metals,” Thin Solid Films 125, 221 (1985). [CrossRef]
  5. M. Bergkvist, A. Roos, C-G. Ribbing, “Diffuse Reflectance Measurements of Interface Roughness,” in Semiconductor Technology, IPAT Workshop, Uppsala, June 1986 (CEP Consultants, Edinburgh, 1986), p. 111.
  6. M. Bergkvist, A. Roos, C-G. Ribbing, “Interference Structure in Optical Scattering from Oxide/Metal Interfaces,” J. Vac. Sci. Technol. A 5, 1661 (1987). [CrossRef]
  7. See, for example, O. S. Heavens, Optical Properties of Thin Solid Films (Dover, New York, 1954), Chap. 4.
  8. G. Hass, H. H. Schroder, A. F. Turner, “Mirror Coatings for Low Visible and High Infrared Reflectance,” J. Opt. Soc. Am. 46, 31 (1956). [CrossRef]
  9. M. Bergkvist, C-G. Ribbing, A. Roos, P. Temple, “Interface Scattering as a Source for Diffuse Interference in Cuprous Oxide on Copper,” Phys. Lett. A 116, 343 (1986). [CrossRef]
  10. P. Temple, “Thin-Film Absorptance Measurements Using Laser Calorimetry,” in Handbook of Optical Constants of Solids, E. Palik, Ed. (Academic, New York, 1985), Chap.7.
  11. J. O. Porteus, “Relation Between the Height Distribution of a Rough Surface and the Reflectance at Normal Incidence,” J. Opt. Soc. Am. 53, 1394 (1963). [CrossRef]

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