A Haidinger interferometer setup was adapted for accurate measurement of thickness and refractive index dispersion in transparent films using some spectral lines of a commercial argon-ion laser. Experimental results are reported and compared with those from other available methods.
© 1989 Optical Society of America
Elisabeth A. de Oliveira and Jaime Frejlich, "Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer," Appl. Opt. 28, 1382-1386 (1989)