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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 7 — Apr. 1, 1989
  • pp: 1382–1386

Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer

Elisabeth A. de Oliveira and Jaime Frejlich  »View Author Affiliations


Applied Optics, Vol. 28, Issue 7, pp. 1382-1386 (1989)
http://dx.doi.org/10.1364/AO.28.001382


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Abstract

A Haidinger interferometer setup was adapted for accurate measurement of thickness and refractive index dispersion in transparent films using some spectral lines of a commercial argon-ion laser. Experimental results are reported and compared with those from other available methods.

© 1989 Optical Society of America

History
Original Manuscript: March 25, 1988
Published: April 1, 1989

Citation
Elisabeth A. de Oliveira and Jaime Frejlich, "Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer," Appl. Opt. 28, 1382-1386 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-7-1382

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