Experimental data with multiple overlapping spectral lines must often be fitted to theoretical line shape models. This paper describes an efficient program for performing least-squares fits of such data to Galatry and Voigt profiles. The algorithm and program design considerations are presented in detail, and some examples are given to demonstrate its use. The procedure described in this paper may also be used for more complex line shape profiles.
© 1989 Optical Society of America
Original Manuscript: June 22, 1988
Published: April 15, 1989
Xiang Ouyang and Philip L. Varghese, "Reliable and efficient program for fitting Galatry and Voigt profiles to spectral data on multiple lines," Appl. Opt. 28, 1538-1545 (1989)