A simple interference microscope based on a fringe scanning technique is described. This interference microscope can provide quantitative phase information of a phase object. The theory and experimental results are presented.
© 1989 Optical Society of America
Jun Chen, Naoshi Baba, and Kazumi Murata, "Quantitative measurement of a phase object by fringe scanning interference microscopy," Appl. Opt. 28, 1615-1617 (1989)