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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 9 — May. 1, 1989
  • pp: 1615–1617

Quantitative measurement of a phase object by fringe scanning interference microscopy

Jun Chen, Naoshi Baba, and Kazumi Murata  »View Author Affiliations


Applied Optics, Vol. 28, Issue 9, pp. 1615-1617 (1989)
http://dx.doi.org/10.1364/AO.28.001615


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Abstract

A simple interference microscope based on a fringe scanning technique is described. This interference microscope can provide quantitative phase information of a phase object. The theory and experimental results are presented.

© 1989 Optical Society of America

History
Original Manuscript: September 7, 1988
Published: May 1, 1989

Citation
Jun Chen, Naoshi Baba, and Kazumi Murata, "Quantitative measurement of a phase object by fringe scanning interference microscopy," Appl. Opt. 28, 1615-1617 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-9-1615

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