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Applied Optics

Applied Optics


  • Vol. 28, Iss. 9 — May. 1, 1989
  • pp: 1685–1691

Raman scattering temperature probe of laser disk marking

Pui-Kwong Chan and Timothy R. Hart  »View Author Affiliations

Applied Optics, Vol. 28, Issue 9, pp. 1685-1691 (1989)

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The laser-induced temperature rise in a dye/polymer system for optical storage was directly obtained by measuring the intensity ratio of the Raman scattered radiations (anti-Stokes to Stokes). The laser beam that writes is used to collect scattering data. Computer simulated laser-induced temperature distribution and its corresponding intensity ratio were used to extract the actual temperature information developed on the recording films. Experiments have been done at laser powers below and up to the point of threshold of marking.

© 1989 Optical Society of America

Original Manuscript: November 11, 1987
Published: May 1, 1989

Pui-Kwong Chan and Timothy R. Hart, "Raman scattering temperature probe of laser disk marking," Appl. Opt. 28, 1685-1691 (1989)

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