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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 1 — Jan. 1, 1990
  • pp: 129–132

Absolute reflectometer for the mid infrared region

Dan Sheffer, Uri P. Oppenheim, and Adam D. Devir  »View Author Affiliations


Applied Optics, Vol. 29, Issue 1, pp. 129-132 (1990)
http://dx.doi.org/10.1364/AO.29.000129


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Abstract

An absolute reflectometer for the 0.8–5.5-μm wavelength region is described. It is based on integrating spheres and uses the third Taylor method in the 7°/d configuration. An improved theory for the reduction of the data is presented, and results for several diffuse gold samples are given.

© 1990 Optical Society of America

History
Original Manuscript: March 8, 1989
Published: January 1, 1990

Citation
Dan Sheffer, Uri P. Oppenheim, and Adam D. Devir, "Absolute reflectometer for the mid infrared region," Appl. Opt. 29, 129-132 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-1-129

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