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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 1 — Jan. 1, 1990
  • pp: 19–23

Refractive index of amorphous carbon near its K-edge

Eberhard Spiller  »View Author Affiliations


Applied Optics, Vol. 29, Issue 1, pp. 19-23 (1990)
http://dx.doi.org/10.1364/AO.29.000019


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Abstract

The refractive index of the amorphous carbon layers inside multilayer soft x-ray mirrors is derived in the λ = 42–58-Å wavelength range by measuring the shift in the Bragg angle caused by refraction. Reflectivity curves are measured with a reflectometer behind a zone plate monochromator at the National Synchrotron Light Source. The monochromator consists only of a freestanding zone plate of gold and an exit slit and is free of any of the contamination problems often found in monochromators that contain mirrors.

© 1990 Optical Society of America

History
Original Manuscript: November 18, 1988
Published: January 1, 1990

Citation
Eberhard Spiller, "Refractive index of amorphous carbon near its K-edge," Appl. Opt. 29, 19-23 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-1-19

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