In this paper we extend and study the method for generating contours of diffuse objects employing a dual beam illumination coupled with electronic speckle pattern interferometry. The sensitivity and the orientation of the contour planes are analyzed. A novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are also presented. The theoretical and the experimental results show good agreement.
© 1990 Optical Society of America
Original Manuscript: July 24, 1989
Published: May 1, 1990
Charles Joenathan, Berthold Pfister, and H. J. Tiziani, "Contouring by electronic speckle pattern interferometry employing dual beam illumination," Appl. Opt. 29, 1905-1911 (1990)