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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 13 — May. 1, 1990
  • pp: 1974–1978

Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment

Helene E. de Bruijn, Rob P. H. Kooyman, and Jan Greve  »View Author Affiliations


Applied Optics, Vol. 29, Issue 13, pp. 1974-1978 (1990)
http://dx.doi.org/10.1364/AO.29.001974


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Abstract

In this paper we present a fast method for the determination of dielectric permittivity = −r + i∊i and thickness d of metal layers from surface plasmon resonance reflection curves. The method is an iteration process using starting parameters derived directly from a reflection curve. The method is tested with simulations and is applied to experimental results. Accuracies reached for silver layers between 25–100 nm and gold layers between 40–75 nm are better than: r ±1%; i ±13% and d ±8%.

© 1990 Optical Society of America

History
Original Manuscript: October 4, 1989
Published: May 1, 1990

Citation
Helene E. de Bruijn, Rob P. H. Kooyman, and Jan Greve, "Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment," Appl. Opt. 29, 1974-1978 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-13-1974

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