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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 14 — May. 10, 1990
  • pp: 2091–2098

Entropy optimized filter for pattern recognition

Michael Fleisher, Uri Mahlab, and Joseph Shamir  »View Author Affiliations


Applied Optics, Vol. 29, Issue 14, pp. 2091-2098 (1990)
http://dx.doi.org/10.1364/AO.29.002091


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Abstract

Properties of the entropy function encountered in physics and information theory are employed in the generation of highly selective spatial filters for pattern recognition. Computer simulations and laboratory demonstrate efficient recognition of single patterns or classes even when these are submerged in experiments high level random noise.

© 1990 Optical Society of America

History
Original Manuscript: June 30, 1988
Published: May 10, 1990

Citation
Michael Fleisher, Uri Mahlab, and Joseph Shamir, "Entropy optimized filter for pattern recognition," Appl. Opt. 29, 2091-2098 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-14-2091

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