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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 15 — May. 20, 1990
  • pp: 2289–2294

Longterm changes of silicon photodiodes and their use for photometric standardization

George Eppeldauer  »View Author Affiliations


Applied Optics, Vol. 29, Issue 15, pp. 2289-2294 (1990)
http://dx.doi.org/10.1364/AO.29.002289


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Abstract

A secondary standard silicon photodiode matched with a V-lambda filter was calibrated against primary standard, self-calibrated inversion layer silicon photodiodes, to achieve a high accuracy photometer, according to the new definition of the canadela (the photometric base unit). The measured several percent/year specular spectral reflectance change of the windowless primary standard photodiodes was eliminated by their repeated self-calibration. This self-calibration also eliminated the measured several tenth of a percent/year spectral response change of the secondary standard silicon photodiode. The secondary standard detector could be a nonunity quantum efficiency light detector. The spectral response calibration of the V-lambda matched detector of medium spectral mismatch ( f 1 = 3.0 %) against the absolute spectral responses of three self-calibrated photodiodes resulted in a standard deviation of 0.17% in luminous flux (lumen) calibration. Also illuminance (lux) and light intensity (candela) calibrations were derived from the above primary photometric calibration. It is shown that the V-lambda matched photometer with the above spectral calibration can be used for accurate photometric measurements for all kinds of light sources of known spectral power distribution.

© 1990 Optical Society of America

History
Original Manuscript: March 2, 1989
Published: May 20, 1990

Citation
George Eppeldauer, "Longterm changes of silicon photodiodes and their use for photometric standardization," Appl. Opt. 29, 2289-2294 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-15-2289


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References

  1. G. Eppeldauer, “Temperature Dependent Inversion Layer Photodiode Self-Calibration,” in Proceedings Twelfth International Symposium on Photon Detectors (IMEKO, Varna, Bulgaria, 1986).
  2. K. D. Stock, “Temporal Stability of Silicon Photodiodes,” in Proceedings Twelfth International Symposium on Photon Detectors (IMEKO, Varna, Bulgaria, 1986).
  3. K. D. Stock, R. Heine, “On the Aging of Photovoltaic Cells,” Optik (Weimar) 71, 137–142 (1985).
  4. E. F. Zalewski, J. Geist, “Silicon Photodiode Absolute Spectral Response Self-Calibration,” Appl. Opt. 19, 1214–1216 (1980). [CrossRef] [PubMed]
  5. J. Geist, E. F. Zalewski, A. R. Schaefer, “Spectral Response Self-Calibration and Interpolation of Silicon Photodiodes,” Appl. Opt. 19, 3795–3799 (1980). [CrossRef] [PubMed]
  6. P. J. Key, N. P. Fox, M. L. Rastello, “Oxide-Bias Measurements in the Silicon Photodiode Self-Calibration Technique,” Metrologia 21, 81–87 (1985). [CrossRef]
  7. A. R. Schaefer, E. F. Zalewski, J. Geist: Silicon Detector Nonlinearity and Related Effects,” Appl. Opt. 22, 1232–1236 (1983). [CrossRef] [PubMed]
  8. J. L. Gardner, F. J. Wilkinson, “Response Time and Linearity of Inversion Layer Silicon Photodiodes,” Appl. Opt. 24, 1531–1534 (1985). [CrossRef] [PubMed]
  9. G. Eppeldauer, “High Sensitivity Absolute Radiometer,” in Proceedings, Tenth International Symposium on Photon Detectors (IMEKO, Berlin(W), 1982), pp. 145–146.
  10. G. Eppeldauer, “Measurement of Very Low Light Intensities by Photovoltaic Cells,” in Proceedings, Eleventh International Symposium on Photon Detectors (IMEKO, Weimar, 1984), proc. 182.
  11. G. Eppeldauer, M. Racz, “Compact Self-Calibarating Setup for High Sensitivity Absolute Light Measurements,” in Transactions, Twentieth CIE Session, Amsterdam (1983) 1, paper E19/1–3.
  12. G. Eppeldauer, “Simple Realization of the Radiometric and Photometric Scales,” in Proceedings, Tenth IMEKO Congress (IMEKO, Praha, 1985) 4, p. 208.
  13. Methods of Characterizing Illuminance Meters and Luminance Meters (CIE Publication 69, 1987) p. 9.
  14. Certain commercial components are identified in this paper to adequately specify the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology nor does it imply that the components identified are necessarily the best available for the purpose.
  15. R. L. Booker, D. A. McSparron, NBS Measurement Services: Photometric Calibrations (NBS Special Publication 250-15, October, 1987), pp. 3–6.
  16. J. Bonhoure, “Photometric Standards of the National Laboratories,” Metrologia 25, 125-(1988). [CrossRef]

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