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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 15 — May. 20, 1990
  • pp: 2320–2324

Thickness matching in planar multilayer waveguides

H. J. Frankena, J. de Jong, H. Oltmans, and H. van Brug  »View Author Affiliations


Applied Optics, Vol. 29, Issue 15, pp. 2320-2324 (1990)
http://dx.doi.org/10.1364/AO.29.002320


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Abstract

A theoretical method is described from which the thickness of an arbitrary layer in a dielectric multilayer stack is determined if all other thicknesses and all refractive indices are given, such that a prescribed effective index for a given mode of the stack is obtained. The same theory can determine the optimal cover thickness of such a stack for prism coupling. Experimental verification shows effective indices that are in agreement with the designed values.

© 1990 Optical Society of America

History
Original Manuscript: July 10, 1989
Published: May 20, 1990

Citation
H. J. Frankena, J. de Jong, H. Oltmans, and H. van Brug, "Thickness matching in planar multilayer waveguides," Appl. Opt. 29, 2320-2324 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-15-2320

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