OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 29, Iss. 15 — May. 20, 1990
  • pp: 2320–2324

Thickness matching in planar multilayer waveguides

H. J. Frankena, J. de Jong, H. Oltmans, and H. van Brug  »View Author Affiliations

Applied Optics, Vol. 29, Issue 15, pp. 2320-2324 (1990)

View Full Text Article

Enhanced HTML    Acrobat PDF (518 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



A theoretical method is described from which the thickness of an arbitrary layer in a dielectric multilayer stack is determined if all other thicknesses and all refractive indices are given, such that a prescribed effective index for a given mode of the stack is obtained. The same theory can determine the optimal cover thickness of such a stack for prism coupling. Experimental verification shows effective indices that are in agreement with the designed values.

© 1990 Optical Society of America

Original Manuscript: July 10, 1989
Published: May 20, 1990

H. J. Frankena, J. de Jong, H. Oltmans, and H. van Brug, "Thickness matching in planar multilayer waveguides," Appl. Opt. 29, 2320-2324 (1990)

Sort:  Author  |  Year  |  Journal  |  Reset  


Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1 Fig. 2 Fig. 3
Fig. 4

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited