We describe an apparatus for measuring the optical characteristics of grating coupled surface emitting semiconductor lasers. These measurements include far and near field measurements, spectrum, and total power. The far field can be determined with an absolute accuracy of 0.01°.
© 1990 Optical Society of America
Original Manuscript: November 9, 1989
Published: June 20, 1990
Robert G. Waarts, "Optical characterization of grating surface emitting semiconductor lasers," Appl. Opt. 29, 2718-2721 (1990)