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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 22 — Aug. 1, 1990
  • pp: 3203–3204

Spectral characteristics of a narrowband rejection filter

Larry Edmonds, Philip Baumeister, M. Eric Krisl, and Norman Boling  »View Author Affiliations


Applied Optics, Vol. 29, Issue 22, pp. 3203-3204 (1990)
http://dx.doi.org/10.1364/AO.29.003203


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Abstract

A krypton ion laser was used to measure the spectral characteristics of a narrowband multilayer dielectric rejection filter produced by plasma chemical vapor deposition.

© 1990 Optical Society of America

History
Original Manuscript: September 14, 1989
Published: August 1, 1990

Citation
Larry Edmonds, Philip Baumeister, M. Eric Krisl, and Norman Boling, "Spectral characteristics of a narrowband rejection filter," Appl. Opt. 29, 3203-3204 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-22-3203

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