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Applied Optics

Applied Optics


  • Vol. 29, Iss. 22 — Aug. 1, 1990
  • pp: 3255–3265

Ronchi test and a new phase reduction algorithm

Der-Shen Wan and Ding-Tin Lin  »View Author Affiliations

Applied Optics, Vol. 29, Issue 22, pp. 3255-3265 (1990)

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To fully interpret the Ronchigram, a good automatic phase reduction algorithm is necessary. A new phase reduction algorithm, originally designed for interferometry test of large optics, is presented for the Ronchi test. Due to the common path property, only two Ronchigrams shifted by π/2 are necessary for the reproducing phase. Accuracy can be better than one-thirtieth of the grating space. Methods are suggested for finding spherical aberration and astigmatism without integrating the phase using the Ronchi test. Tests of results using the new algorithm show good agreement with typical interferometry tests.

© 1990 Optical Society of America

Original Manuscript: August 15, 1989
Published: August 1, 1990

Der-Shen Wan and Ding-Tin Lin, "Ronchi test and a new phase reduction algorithm," Appl. Opt. 29, 3255-3265 (1990)

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  1. T. Yatagi, “Fringe Scanning Ronchi Test for Aspherical Surfaces,” Appl. Opt. 23, 3676–3679 (1984). [CrossRef]
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