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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 26 — Sep. 10, 1990
  • pp: 3753–3765

Superresolving phase conjugate scanning microscope

Chongchang Mao, Kristina M. Johnson, and W. Thomas Cathey  »View Author Affiliations


Applied Optics, Vol. 29, Issue 26, pp. 3753-3765 (1990)
http://dx.doi.org/10.1364/AO.29.003753


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Abstract

Analytical and experimental results of a new type of optical scanning microscope, which uses a phase conjugate mirror and pinholes to achieve superresolution, are presented. The phase conjugate scanning microscope has a higher Rayleigh resolution limit and better sectioning discrimination than conventional, single pass, and double pass scanning microscopes. It also can reduce the effect of static and dynamic aberrations on the imaging process, is very easy to align, and has the potential of introducing optical power gain into the system.

© 1990 Optical Society of America

History
Original Manuscript: December 19, 1989
Published: September 10, 1990

Citation
Chongchang Mao, Kristina M. Johnson, and W. Thomas Cathey, "Superresolving phase conjugate scanning microscope," Appl. Opt. 29, 3753-3765 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-26-3753


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References

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