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Applied Optics

Applied Optics


  • Vol. 29, Iss. 28 — Oct. 1, 1990
  • pp: 4276–4283

Measurements of absorption losses in TiO2 films by a collinear photothermal deflection technique

Mireille Commandré and Emile Pelletier  »View Author Affiliations

Applied Optics, Vol. 29, Issue 28, pp. 4276-4283 (1990)

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We review the principle of photothermal deflection for measuring absorption losses in TiO2 films. A collinear arrangement gives the best sensitivity for the detection of losses in a low absorbing film deposited on a transparent substrate. The nineteen TiO2 films produced by six different processes (electron beam evaporation, ion assisted deposition, ion beam sputtering, ion plating, …), discussed at the 1986 Optical Society of America annual meeting, are measured by this technique. The extinction coefficients of the different films do not show obvious correlation with the deposition method. An important fact is that we have detected a variation in absorption as a function of time on some layers. This absorption shift is connected with the illumination conditions of the sample under study (wavelength: 600 nm; incident power: 400 W/cm2). Experimental results over time are given. The evolution of the photothermal signal is different from one sample to another. This phenomenon is partially reversible and depends on moisture degree of atmosphere.

© 1990 Optical Society of America

Original Manuscript: January 3, 1989
Published: October 1, 1990

Mireille Commandré and Emile Pelletier, "Measurements of absorption losses in TiO2 films by a collinear photothermal deflection technique," Appl. Opt. 29, 4276-4283 (1990)

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  1. P. Bousquet, F. Flory, P. Roche, “Scattering From Multilayer Thin Films: Theory and Experiment,” J. Opt. Soc. Am. 71, 1115–1123 (1981). [CrossRef]
  2. P. Roche, E. Pelletier, “Characterizations of Optical Surfaces by Measurement of Scattering Distribution,” Appl. Opt. 23, 3561–3566 (1984). [CrossRef] [PubMed]
  3. A. C. Boccara, D. Fournier, W. Jackson, N. M. Amer, “Sensitive Photothermal Deflection Technique for Measuring Absorption in Optically Thin Media,” Opt. Lett. 5, 377–379 (1980). [CrossRef] [PubMed]
  4. W. B. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, “Photothermal Deflection Spectroscopy and Detection,” Appl. Opt. 20, 1333–1344 (1981). [CrossRef] [PubMed]
  5. M. Commandre, L. Bertrand, G. Albrand, E. Pelletier, “Measurement of Absorption Losses of Optical Thin Film Components by Photothermal Deflection Spectroscopy,” Proc. Soc. Photo-Opt. Instrum. Eng. 805, 128–135 (1987).
  6. J. P. Borgogno, B. Lazarides, E. Pelletier, “Automatic Determination of the Optical Constants of Inhomogeneous Thin Films,” Appl. Opt. 21, 4020–4029 (1982). [CrossRef] [PubMed]
  7. C. Carniglia, presented at Optical Materials and Thin Films Technical Group Meeting at the 1986 Optical Society of America Annual Meeting (unpublished); U. J. Gibson, presented at Optical Materials and Thin Films Technical Group Meeting at the 1987 Optical Society of America Annual Meeting (unpublished).
  8. J. M. Bennett et al., “Comparison of the Properties of Titanium Dioxide Films Prepared Using Different Techniques,” Appl. Opt. 28, 3303–3317 (1989). [CrossRef] [PubMed]
  9. J. P. Borgogno, B. Lazarides, P. Roche, “An Improved Method for the Determination of the Extinction Coefficient of Thin Film Materials,” Thin Solid Films 102, 209–220 (1983). [CrossRef]
  10. H. A. Macleod, “Microstructure of Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 21–28 (1982).
  11. H. A. Macleod, D. Richmond, “Moisture Penetration Patterns in Thin Films,” Thin Solid Films 37, 163–169 (1976). [CrossRef]

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