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Applied Optics

Applied Optics


  • Vol. 29, Iss. 28 — Oct. 1, 1990
  • pp: 4284–4292

Vacuum ultraviolet thin films. 1: Optical constants of BaF2, CaF2, LaF3, MgF2, Al2O3, HfO2, and SiO2 thin films

Muamer Zukic, Douglas G. Torr, James F. Spann, and Marsha R. Torr  »View Author Affiliations

Applied Optics, Vol. 29, Issue 28, pp. 4284-4292 (1990)

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The optical constants of MgF2 (bulk) and BaF2, CaF2, LaF3, MgF2, Al2O3, HfO2, and SiO2 films deposited on MgF2 substrates are determined from photometric measurements through an iteration process of matching calculated and measured values of the reflectance and transmittance in the 120–230-nm vacuum ultraviolet wavelength region. The potential use of the listed fluorides and oxides as vacuum ultraviolet coating materials is discussed in part 2 of this paper.

© 1990 Optical Society of America

Original Manuscript: September 28, 1989
Published: October 1, 1990

Muamer Zukic, Douglas G. Torr, James F. Spann, and Marsha R. Torr, "Vacuum ultraviolet thin films. 1: Optical constants of BaF2, CaF2, LaF3, MgF2, Al2O3, HfO2, and SiO2 thin films," Appl. Opt. 29, 4284-4292 (1990)

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