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Applied Optics

Applied Optics


  • Vol. 29, Iss. 30 — Oct. 20, 1990
  • pp: 4435–4440

Simplified analysis and structural design for ridge MOS optical waveguides

Chunsheng Ma and Shiyong Liu  »View Author Affiliations

Applied Optics, Vol. 29, Issue 30, pp. 4435-4440 (1990)

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A simplified method is presented for analyzing the optical characteristics of ridge MOS optical waveguides. Equations are derived for calculating the effective refractive indices and the absorption loss coefficients of the E p q x modes. The computations are performed for air–Au–air/SiO2/GaAs/AlGaAs ridge MOS waveguides. To achieve single-mode propagation with low absorption loss, appropriate selection of the structural parameters for this kind of waveguide is discussed.

© 1990 Optical Society of America

Original Manuscript: March 6, 1990
Published: October 20, 1990

Chunsheng Ma and Shiyong Liu, "Simplified analysis and structural design for ridge MOS optical waveguides," Appl. Opt. 29, 4435-4440 (1990)

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