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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 30 — Oct. 20, 1990
  • pp: 4468–4472

Refractive index profile measurement techniques by reflectivity profiling: vidicon imaging, beam scanning, and sample scanning

Jochen Steffen, Andreas Neyer, Edgar Voges, and Norbert Hecking  »View Author Affiliations


Applied Optics, Vol. 29, Issue 30, pp. 4468-4472 (1990)
http://dx.doi.org/10.1364/AO.29.004468


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Abstract

The refractive index profiles of titanium-diffused LiNbO3 planar and channel waveguides are determined directly by measuring the reflectivity of angular polished surfaces. Three measurement techniques are described and compared: (1) large area illumination of the angular polished waveguide and imaging of the reflected light to a vidicon, (2) scanning of a focused beam across the sample, and (3) scanning of the sample under a focused beam. Preference is given to the last method which provides an accuracy of Δn/n = 10−4 with a local resolution of the index profile of <0.1 μm in depth and ~1 μm in width.

© 1990 Optical Society of America

History
Original Manuscript: February 1, 1989
Published: October 20, 1990

Citation
Jochen Steffen, Andreas Neyer, Edgar Voges, and Norbert Hecking, "Refractive index profile measurement techniques by reflectivity profiling: vidicon imaging, beam scanning, and sample scanning," Appl. Opt. 29, 4468-4472 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-30-4468

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