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Applied Optics

Applied Optics


  • Vol. 29, Iss. 30 — Oct. 20, 1990
  • pp: 4468–4472

Refractive index profile measurement techniques by reflectivity profiling: vidicon imaging, beam scanning, and sample scanning

Jochen Steffen, Andreas Neyer, Edgar Voges, and Norbert Hecking  »View Author Affiliations

Applied Optics, Vol. 29, Issue 30, pp. 4468-4472 (1990)

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The refractive index profiles of titanium-diffused LiNbO3 planar and channel waveguides are determined directly by measuring the reflectivity of angular polished surfaces. Three measurement techniques are described and compared: (1) large area illumination of the angular polished waveguide and imaging of the reflected light to a vidicon, (2) scanning of a focused beam across the sample, and (3) scanning of the sample under a focused beam. Preference is given to the last method which provides an accuracy of Δn/n = 10−4 with a local resolution of the index profile of <0.1 μm in depth and ~1 μm in width.

© 1990 Optical Society of America

Original Manuscript: February 1, 1989
Published: October 20, 1990

Jochen Steffen, Andreas Neyer, Edgar Voges, and Norbert Hecking, "Refractive index profile measurement techniques by reflectivity profiling: vidicon imaging, beam scanning, and sample scanning," Appl. Opt. 29, 4468-4472 (1990)

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  1. M. Minakata, S. Saito, M. Shibata, S. Miyazawa, “Precise Determination of Refractive Index Changes in Ti-Diffused LiNbO3 Optical Waveguides,” J. Appl. Phys. 49, 4677–4682 (1978). [CrossRef]
  2. P. Hertel, H. P. Menzler, “Improved INverse WKB Procedure to Reconstruct Refractive Index Profiles of Dielectric Planar Waveguides,” Appl. Phys. B 44, 75–80 (1985).
  3. J. Noda, M. Minakata, S. Saito, N. Uchida, “Precise Determination of Refractive Index and Thickness in the Ti-Diffused LiNbO3 Waveguides,” J. Opt. Soc. Am. 68, 1690–1693 (1979). [CrossRef]
  4. J. Ctyroky, M. Hofman, J. Janta, J. Schrofel, “3-D-Analysis of LiNbO3:Ti Channel Waveguides and Directional Couplers,” IEEE J. Quantum Electron. QE-20, 400–409 (1984). [CrossRef]
  5. A. Neyer, “Direct Measurement of Refractive Index Profiles of Ti:LiNbO3 Slab Waveguides,” in Integrated Optics, Proceedings, ECIO ’85, H. P. Nolting, R. Ulrich, Eds., (Springer-Verlag, New York, 1985), pp. 67–70.
  6. H.-J. Lilienhof, K. F. Heidemann, D. Ritter, E. Voges, “Index Profiles of Multimode Optical Strip Waveguides by Field-Enhanced Ion Exchange in Glass,” Opt. Commun. 35, 49–53 (1980). [CrossRef]
  7. A. Loffredo, “A New Optical Scanning Microscope for Refractive Index Profile Measurement,” Opt. Commun. 9, 88–91 (1988).
  8. H.-J. Lilienhof, E. Voges, D. Ritter, B. Pantschew, “Field-Induced Index Profiles of Multimode Ion-Exchanged Strip Waveguides,” IEEE J. Quantum Electron. QE-18, 1877–1883 (1982). [CrossRef]
  9. K. F. Heidemann, “Complex-Refractive-Index Profiles of 4 MeV Ge Ion-Irradiation Damage in Silicon,” Philos. Mag. B 44, 465–485 (1985). [CrossRef]
  10. S. Fouchet, A. Carenco, C. Daguet, R. Guglielmi, L. Riviere, “Wavelength Dispersion of Ti Induced Refractive Index Changes in LiNbO3 as a Function of Diffusion Parameters,” IEEE/OSA J. Lightwave Technol. LT-5, 700–708 (1987). [CrossRef]
  11. A. Neyer, T. Pohlmann, “Fabrication of Low-Loss Ti-Diffused LiNbO3 Waveguides Using a Closed Platinum Crucible,” Electron. Lett. 23, 1187–1188 (1987). [CrossRef]
  12. R. J. Holmes, D. M. Smyth, “Titanium Diffusion into LiNbO3 as a Function of Stoichiometry,” J. Appl. Phys. 55, 3531–3535 (1984). [CrossRef]
  13. J. Noda, M. Fukuma, S. Saito, “Effect of Mg Diffusion on Ti-Diffused LiNbO3 Waveguides,” J. Appl. Phys. 49, 3150–3154 (1978). [CrossRef]

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