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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 31 — Nov. 1, 1990
  • pp: 4546–4547

Refractive index measurement using a standard compensating method

Yi Li, Chuanzeng Pan, and Guohua Li  »View Author Affiliations


Applied Optics, Vol. 29, Issue 31, pp. 4546-4547 (1990)
http://dx.doi.org/10.1364/AO.29.004546


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Abstract

The first three significant digits of a sample’s refractive index are compensated by a standard, therefore a precise measurement, which is the same as the refractive index of the standard, can be obtained. The method only needs a thin sample.

© 1990 Optical Society of America

History
Original Manuscript: August 7, 1989
Published: November 1, 1990

Citation
Yi Li, Chuanzeng Pan, and Guohua Li, "Refractive index measurement using a standard compensating method," Appl. Opt. 29, 4546-4547 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-31-4546

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