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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 31 — Nov. 1, 1990
  • pp: 4633–4637

Reflectance of an absorbing medium for incident light of arbitrary polarization: correlation between the oscillatory behavior and the complex plane

M. A. Ali, K. Mitwally, and Samir A. Ahmed  »View Author Affiliations


Applied Optics, Vol. 29, Issue 31, pp. 4633-4637 (1990)
http://dx.doi.org/10.1364/AO.29.004633


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Abstract

The reflectance of an absorbing medium Rθ(ϕ) for incident light of an arbitrary state of polarization is considered as a function of the compex dielectic constant ɛ; ϕ is the angle incidence and θ is an incident polarization parameter, for which cos2θ and sin2θ give the power fractions of incident radiation that are p- and s-polarized, respectively. Our objective is to explore the complex ɛ-plane and define the domains for which the different types of Rθ(ϕ) vs ϕ curves (monotonic, single minimum, and secondary maximum and minimum) occur. An ethanolic solution of Rhodamine B, an organic laser dye luminofor with a well-defined resonance absorption spectrum, was chosen as the absorbing medium. We were able to define the criteria for three distinctly different types of behavior of Rθ(ϕ).

© 1990 Optical Society of America

History
Original Manuscript: January 11, 1990
Published: November 1, 1990

Citation
M. A. Ali, K. Mitwally, and Samir A. Ahmed, "Reflectance of an absorbing medium for incident light of arbitrary polarization: correlation between the oscillatory behavior and the complex ∊ plane," Appl. Opt. 29, 4633-4637 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-31-4633


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References

  1. R. M. A. Azzam, A. M. El-Saba, “Reflectance of an Absorbing Substrate for Incident Light of Arbitrary Polarization Appearance of a Secondary Maximum at Oblique Incidence,” Appl. Opt. 27, 4034–4037 (1988). [CrossRef] [PubMed]
  2. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
  3. W. R. Hunter, “Errors in Using Reflectance vs Angle of Incidence Method for Measuring Optical Constants,” J. Opt. Soc. Am. 55, 1197–1204 (1965). [CrossRef]
  4. H. B. Holl, “Specular Reflection and Characteristics of Reflected Light,” J. Opt. Soc. Am. 57, 683–690 (1967). [CrossRef]
  5. J. M. Bennett, H. E. Bennett, “Polarization,” in Handbook of Optics, W. G. Driscoll, W. Vaughan, Eds. (McGraw-Hill, New York, 1978).
  6. D. E. Aspnes, A. A. Studna, “Dielectric Functions and Optical Parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 ev,” Phys. Rev. B 27, 985–1008 (1983). [CrossRef]
  7. R. M. A. Azzam, “Stationary Property of Normal-Incidence Reflection from Isotropic Surfaces,” J. Opt. Soc. Am. 72, 1187–1189 (1982). [CrossRef]
  8. A. Yariv, Quantum Electronics (Wiley, New York, 1975).

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