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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 31 — Nov. 1, 1990
  • pp: 4715–4719

Differential phase quadrature surface profiling interferometer

Basil A. Omar, Alan J. Holloway, and David C. Emmony  »View Author Affiliations


Applied Optics, Vol. 29, Issue 31, pp. 4715-4719 (1990)
http://dx.doi.org/10.1364/AO.29.004715


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Abstract

This paper describes an optical surface profiling system based on phase quadrature differential interferometry. The optical path difference between two adjacent optical probe beams is measured. Interference phase calculation and sample scanning is controlled by a PC computer. Height sensitivity is of the order of 1 nm and lateral resolution is ~10 μm. Results are given which demonstrate the reproducibility and stability of the system.

© 1990 Optical Society of America

History
Original Manuscript: September 11, 1989
Published: November 1, 1990

Citation
Basil A. Omar, Alan J. Holloway, and David C. Emmony, "Differential phase quadrature surface profiling interferometer," Appl. Opt. 29, 4715-4719 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-31-4715


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References

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  6. J. M. Eastman “Measurement of Surface Profiles Using Differential Interference Microscopy,” Workshop on Optial Fabrication and Testing, Monterey, California (April 18–20, 1984).
  7. J. M. Bennett, “Measuring of the rms Roughness, Autocovariance Function and Other Statistsical Properties of Optical Surfaces Using a FECO Scanning Interferometer,” Appl. Opt. 15, 2705–2721 (1976). [CrossRef] [PubMed]
  8. S. Tolansky, Multiple Scan Interferometry of Surfaces and Films, (Clarendon, Oxford, 1948).
  9. R. C. White, D. C. Emmony, “Active Feedback Stabilization of a Michelson Interferometer Using a Flexure Element,” J. Phys. E 18, 658–663 (1985). [CrossRef]
  10. E. R. Peck, S. W. Obetz, “Wavelength or Length Measurement by Rversible Fringe Counting,” J. Opt. Soc. Am. 43, 505–509 (1985). [CrossRef]
  11. D. Wilkomerson, “Measuring Pulsed Pico-Meter-Displacement Vibrations by Optical Interferometry,” Appl. Phys. Lett. 29, 183–185 (1976). [CrossRef]

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