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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 31 — Nov. 1, 1990
  • pp: 4720–4724

Refractive index detector using Zeeman interferometry

Roger G. Johnston and W. Kevin Grace  »View Author Affiliations


Applied Optics, Vol. 29, Issue 31, pp. 4720-4724 (1990)
http://dx.doi.org/10.1364/AO.29.004720


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Abstract

We discuss the theory and error analysis for an ultrasensitive refractive index detector based on the two-frequency Zeeman effect laser. Experimental measurements on gases agree fairly well with predictions. With a 5-cm pathlength, the typical interferometry stability is Δn = 8 × 10−9/h. Resolution is Δn = 1 × 10−9.

© 1990 Optical Society of America

History
Original Manuscript: November 9, 1989
Published: November 1, 1990

Citation
Roger G. Johnston and W. Kevin Grace, "Refractive index detector using Zeeman interferometry," Appl. Opt. 29, 4720-4724 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-31-4720

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