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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 34 — Dec. 1, 1990
  • pp: 5080–5085

Effective reflectivity from self-imaging in a Talbot cavity and its effect on the threshold of a finite 2-D surface emitting laser array

Easen Ho, Fumio Koyama, and Kenichi Iga  »View Author Affiliations


Applied Optics, Vol. 29, Issue 34, pp. 5080-5085 (1990)
http://dx.doi.org/10.1364/AO.29.005080


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Abstract

Using a self-imaged diffraction coupled model in a Talbot cavity for vertical cavity surface emitting laser arrays, the effect of self-imaged reflections on the lasing threshold of a finite 2-D array was investigated. Array size and the ratio defined by the element diameter/element spacing were found to affect the effective reflectivity as seen from the laser cavities and, ultimately, the device threshold. A general curve showing the dependence of the 2-D coupling coefficient on the array fill factor and array size has been found. Minimum levels of laser facet reflectivities have been obtained as a function of the array fill factor for practical devices with low threshold current densities.

© 1990 Optical Society of America

History
Original Manuscript: November 20, 1989
Published: December 1, 1990

Citation
Easen Ho, Fumio Koyama, and Kenichi Iga, "Effective reflectivity from self-imaging in a Talbot cavity and its effect on the threshold of a finite 2-D surface emitting laser array," Appl. Opt. 29, 5080-5085 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-34-5080

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