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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 34 — Dec. 1, 1990
  • pp: 5193–5197

Heterodyne polarimetry technique for complete amplitude scattering matrix for radiation

Fouad G. Major  »View Author Affiliations


Applied Optics, Vol. 29, Issue 34, pp. 5193-5197 (1990)
http://dx.doi.org/10.1364/AO.29.005193


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Abstract

The phases and amplitudes of all the elements of the scattering matrix for radiation scattered by microparticles are shown to be measurable by a technique which was inspired by the phase differential scattering method developed by Johnston et al. of the Experimental Pathology Group at the Los Alamos National Laboratory. The present method synthesizes a laser beam from a superposition of two coherent beams in which a small frequency offset between perpendicular polarization components has been acoustooptically introduced. The heterodyne signal in the scattered radiation is used to detect the polarimetric null obtained by a variable phase compensator and linear polarizer placed in front of the scattered intensity detector. The reciprocity theorem is used to obtain a complementary set of data to completely determine all the elements of the matrix.

© 1990 Optical Society of America

History
Original Manuscript: December 19, 1989
Published: December 1, 1990

Citation
Fouad G. Major, "Heterodyne polarimetry technique for complete amplitude scattering matrix for radiation," Appl. Opt. 29, 5193-5197 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-34-5193


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References

  1. R. G. Johnston, S. B. Singham, G. C. Salzman, “Phase Differential Scattering from Microspheres,” Appl. Opt. 25, 3566–3572 (1986). [CrossRef] [PubMed]
  2. H. C. van de Hulst, Light Scattering by Small Particles (Dover, New York, 1981), p. 34.
  3. Ref. 2, p. 48.
  4. J.-P. Monchalin, “Heterodyne Interferometric Laser Probe to Measure Continuous Ultrasonic Displacements,” Rev. Sci. Instrum. 56, 543–546 (1985). [CrossRef]
  5. See, for example, A. Yariv, Introduction to Optical Electronics (Holt, Rinehart & Winston, New York, 1976), p. 306.

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