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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 30, Iss. 16 — Jun. 1, 1991
  • pp: 2212–2218

Two-wavelength beam deflection technique for electron density measurements in laser-produced plasmas

Gregory W. Faris and Håkan Bergström  »View Author Affiliations


Applied Optics, Vol. 30, Issue 16, pp. 2212-2218 (1991)
http://dx.doi.org/10.1364/AO.30.002212


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Abstract

We describe the use of a two-wavelength beam deflection technique in the measurement of electron density and expansion velocity in a laser-produced plasma. Beam deflection measurements are made with a spatial resolution of 250 μm, temporal resolution of 25 ns, and a dynamic range of 1000. Several techniques for determining the spatial and temporal variation of the electron density from beam deflection measurements are described.

© 1991 Optical Society of America

History
Original Manuscript: July 18, 1990
Published: June 1, 1991

Citation
Gregory W. Faris and Håkan Bergström, "Two-wavelength beam deflection technique for electron density measurements in laser-produced plasmas," Appl. Opt. 30, 2212-2218 (1991)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-30-16-2212

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