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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 30, Iss. 17 — Jun. 10, 1991
  • pp: 2386–2392

Readout properties of the specklegram recorded in photorefractive Bi12SiO20 crystal

Kiyoshi Nakagawa and Takumi Minemoto  »View Author Affiliations


Applied Optics, Vol. 30, Issue 17, pp. 2386-2392 (1991)
http://dx.doi.org/10.1364/AO.30.002386


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Abstract

The readout properties of the specklegram recorded in a photorefractive Bi12SiO20 (BSO) crystal plate have been investigated by observing the Young fringes and the polarization change of the light transmitted from the BSO plate. The Young fringes can be obtained without an analyzer by any linearly polarized readout beam; they have higher visibility than those obtained from a photographic plate specklegram, since the specklegram recorded in the BSO crystal can be read out by the spatial distribution of both the degree of polarization and the azimuth angle of polarization. Selective interference of a kind is performed.

© 1991 Optical Society of America

History
Original Manuscript: September 20, 1990
Published: June 10, 1991

Citation
Kiyoshi Nakagawa and Takumi Minemoto, "Readout properties of the specklegram recorded in photorefractive Bi12SiO20 crystal," Appl. Opt. 30, 2386-2392 (1991)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-30-17-2386


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References

  1. G. C. Valley, M. B. Klein, “Optimal Properties of Photorefractive Materials for Optical Data Processing,” Opt. Eng. 22, 704–711 (1983).
  2. H. J. Tiziani, K. Leonhardt, J. Klenk, “Real-Time Displacement and Tilt Analysis by a Speckle Technique Using Bi12SiO20 Crystal,” Opt. Commun. 34, 327–331 (1980). [CrossRef]
  3. K. Nakagawa, T. Takatsuji, T. Minemoto, “Measurement of the Displacement Distribution by a Speckle Photography Method Using BSO Crystal,” Opt. Commun. 76, 206–212 (1990). [CrossRef]
  4. J. F. Nye, Physical Properties of Crystals (Oxford U., New York, 1960), pp. 260–274.
  5. F. Vachss, L. Hesselink, “Measurement of the Electrogyration and Electro-Optic Effects in BSO and BGO,” Opt. Commun. 62, 159–165 (1987). [CrossRef]
  6. K. Nakagawa, N. Kajita, J. Chen, T. Minemoto, “Measurement of the Electrogyration Coefficient in Photorefractive Bi12SiO20 Crystal,” J. Appl. Phys. 69, 954–958 (1991). [CrossRef]
  7. G. F. Moore, P. V. Lenzo, E. G. Spencer, A. A. Ballan, “Photoactivity and Field Induced Changes in Optical Rotation in Bismuth Silicon Oxide (Bi12SiO20),” J. Appl. Phys. 40, 2361–2362 (1969). [CrossRef]

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