We describe a method for measuring submicrometer distances with an asymmetric fiber Michelson interferometer having an LED as a source of radiation. By measuring the phase slope of the Fourier components in the frequency domain, it is possible to locate the position of reflections with nanometer precision even in the presence of sample dispersion. The method is compatible with time domain sampling at the Nyquist rate which assures efficiency in data acquisition and processing.
© 1991 Optical Society of America
Original Manuscript: July 16, 1990
Published: July 20, 1991
Bruce L. Danielson and C. Y. Boisrobert, "Absolute optical ranging using low coherence interferometry," Appl. Opt. 30, 2975-2979 (1991)