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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 30, Iss. 22 — Aug. 1, 1991
  • pp: 3200–3204

Profile measurement of an aspheric cylindrical surface from retroreflection

Ding-tin Lin and Der-Shen Wan  »View Author Affiliations


Applied Optics, Vol. 30, Issue 22, pp. 3200-3204 (1991)
http://dx.doi.org/10.1364/AO.30.003200


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Abstract

A new algorithm for measuring the profile of an aspheric cylindrical surface is developed in which directions of the surface normal and slopes at various locations are found with the aid of a retroreflected beam. The locations of retroreflection can be found with the simple algorithm developed in this paper, and the surface profile is integrated from the slope. The accuracy of the new algorithm is determined mostly by the algorithm’s ability to find the true range of the surface being integrated. In the measurement of the surface sagitta over the range of 5000 μm, the accumulated error from the integration is less than 30 μm.

© 1991 Optical Society of America

History
Original Manuscript: March 16, 1990
Published: August 1, 1991

Citation
Ding-tin Lin and Der-Shen Wan, "Profile measurement of an aspheric cylindrical surface from retroreflection," Appl. Opt. 30, 3200-3204 (1991)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-30-22-3200

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