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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 30, Iss. 22 — Aug. 1, 1991
  • pp: 3205–3209

Profile measuring method based on reflection characteristics at a critical angle in a right-angle prism

Tetsuya Matsumoto, Yoichi Kitagawa, Masaaki Adachi, and Takumi Minemoto  »View Author Affiliations


Applied Optics, Vol. 30, Issue 22, pp. 3205-3209 (1991)
http://dx.doi.org/10.1364/AO.30.003205


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Abstract

A new method is proposed for profile measurements using a right-angle prism. With this method, the distance to an object surface is measured by using triangulation based on a change of the critical angle of total reflection. An object surface is illuminated by a scanning laser beam and the incident angle of the scattered light into the prism is measured using the change in the critical angle. Three-dimensional profiles of objects with rough surfaces can be measured with high accuracy.

© 1991 Optical Society of America

History
Original Manuscript: January 4, 1991
Published: August 1, 1991

Citation
Tetsuya Matsumoto, Yoichi Kitagawa, Masaaki Adachi, and Takumi Minemoto, "Profile measuring method based on reflection characteristics at a critical angle in a right-angle prism," Appl. Opt. 30, 3205-3209 (1991)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-30-22-3205

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