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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 30, Iss. 28 — Oct. 1, 1991
  • pp: 4126–4132

Influence of coating thickness on the performance of a Fabry–Perot interferometer

J. J. Monzón, L. L. Sánchez-Soto, and E. Bernabeu  »View Author Affiliations


Applied Optics, Vol. 30, Issue 28, pp. 4126-4132 (1991)
http://dx.doi.org/10.1364/AO.30.004126


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Abstract

The effects of the coating thickness on the physical performance of a Fabry–Perot interferometer (FP) are investigated. The FP is modeled as three media separated by two thin films and not merely by two interfaces. We show that the transmitted intensity obeys an Airy function, but not the reflected intensity because of the appearance of a complex factor accounting for the coupling between the reflected waves in the coatings. The Stokes relations are generalized for this model. We study the dependence of the phase lag of reflection in the coatings on the angle of incidence, which causes a shift in the position of the intensity maxima. We discuss as well the properties of the FP with an absorbing medium in the cavity, defining a merit function that optimizes the compromise between peak transmission and finesse.

© 1991 Optical Society of America

History
Original Manuscript: March 2, 1990
Published: October 1, 1991

Citation
J. J. Monzón, L. L. Sánchez-Soto, and E. Bernabeu, "Influence of coating thickness on the performance of a Fabry–Perot interferometer," Appl. Opt. 30, 4126-4132 (1991)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-30-28-4126


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References

  1. M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1980), Chap. 7.
  2. J. M. Stone, Radiation and Optics (McGraw-Hill, New York, 1963), Sec. 16.7.
  3. C. R. Pidgeon, S. D. Smith, “Resolving power of multilayer filters in nonparallel light,” J. Opt. Soc. Am. 54, 1459–1466 (1964). [CrossRef]
  4. P. C. S. Hayfield, G. W. T. White, “An assessment of the stability of the Drude–Tronstad polarized light method for the study of film growth on polycrystalline metals,” in Ellipsometry in the Measurements of Surfaces and Thin Films, E. Passaglia, R. R. Stromberg, J. Kruger, eds., Natl. Bur. Stand. Misc. Publ. 256 (U.S. GPO, Washington, D.C., 1964), pp. 157–200.For a more recent review of the model see R. M. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1987), Sec. 4.6.
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  6. J. B. Kumer, T. C. James, “Effect of substrate absorption on the performance of solid Fabry-Perot etalons,” Appl. Opt. 27, 4800–4801 (1988). [CrossRef] [PubMed]
  7. M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1980), Sec. 7.6.2.
  8. R. M. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1987), p. 337.
  9. E. D. Palik, ed., Handbook of Optical Constants of Solids (Academic, Orlando, Fla., 1985).
  10. W. H. Steel, Interferometry (Cambridge U. Press, Cambridge, 1983), Sec. 9.3.1.

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