Rate equations have been used to analyze the variations of the outputs from the facets of the diodes being coated during the antireflection-coating process. Good agreement between the experimental recordings and theoretical predictions has been achieved. As a result, an auxiliary criterion for on-time assessment of the antireflection coating has been established.
© 1991 Optical Society of America
Original Manuscript: January 9, 1990
Published: November 1, 1991
Jianguo Chen, Dayi Li, and Yucun Lu, "Experimental and theoretical studies on monitored signals from semiconductor diodes undergoing antireflection coatings," Appl. Opt. 30, 4554-4559 (1991)