Abstract
Optical particle sizing in the range of 10 nm up to several micrometers by means of quasi-elastic and elastic light scattering requires sophisticated data inversion techniques. We have developed an optimized regularization technique that can be used for the inversion of such light-scattering data. The technique has been successfully tested for a large number of simulated and measured data. It is easy to handle. Typical problems that arise in practical applications are discussed.
© 1991 Optical Society of America
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