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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 30, Iss. 7 — Mar. 1, 1991
  • pp: 745–751

Grating interferometer with extremely high stability, suitable for measuring small refractive index changes

Thomas H. Barnes, Kenji Matsumoto, Tomoaki Eiju, Kyofumi Matsuda, and Noatake Ooyama  »View Author Affiliations


Applied Optics, Vol. 30, Issue 7, pp. 745-751 (1991)
http://dx.doi.org/10.1364/AO.30.000745


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Abstract

We describe here a grating interferometer with extremely high stability and which can be used as a differential refractometer. The instrument uses heterodyne techniques to achieve high sensitivity. We present an analysis of the operation of the system and results which show that it has a long term stability of the order of 1/1500 wavelength over 2 h.

© 1991 Optical Society of America

History
Original Manuscript: January 9, 1989
Published: March 1, 1991

Citation
Thomas H. Barnes, Kenji Matsumoto, Tomoaki Eiju, Kyofumi Matsuda, and Noatake Ooyama, "Grating interferometer with extremely high stability, suitable for measuring small refractive index changes," Appl. Opt. 30, 745-751 (1991)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-30-7-745

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