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Applied Optics

Applied Optics


  • Vol. 30, Iss. 7 — Mar. 1, 1991
  • pp: 884–886

Generalized photodiode self-calibration formula

R. Köhler, Jon Geist, and J. Bonhoure  »View Author Affiliations

Applied Optics, Vol. 30, Issue 7, pp. 884-886 (1991)

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We have derived the photodiode self-calibration formula for calculating the internal quantum efficiency of silicon photodiodes from the results of one, two, or three independent self-calibration experiments and from the results of the oxide bias and reverse bias experiments in conjunction with a calculation of the effect of Auger recombination. We show that the formula published elsewhere for these three effects is not correct.

© 1991 Optical Society of America

Original Manuscript: May 6, 1990
Published: March 1, 1991

R. Köhler, Jon Geist, and J. Bonhoure, "Generalized photodiode self-calibration formula," Appl. Opt. 30, 884-886 (1991)

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  1. E. F. Zalewski, J. Geist, “Silicon Photodiode Absolute Spectral Response Self-Calibration,” Appl. Opt. 19, 1214–1216 (1980). [CrossRef] [PubMed]
  2. J. Geist, “Silicon Photodiode Self-Calibration,” in Theory and Practice of Radiation Thermometry, D. P. DeWitt, G. D. Nutter, Eds. (Wiley, New York, 1988), Chap. 14. [CrossRef]
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  6. Reference to a commercial product is included for completeness of exposition, and constitutes neither an endorsement by NIST nor representation that the product referenced is the best available for the purpose.
  7. PC-1D is available from Iowa State University Research Foundation (ISURF), Ames, IA 50011, copyright 1985.
  8. J. Geist, H. Baltes, “High Accuracy Modeling of Photodiode Quantum Efficiency,” Appl. Opt. 28, 3929–3939 (1989). [CrossRef] [PubMed]

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