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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 1 — Jan. 1, 1992
  • pp: 90–94

Infrared refractive index of germanium–silicon alloy crystals

Josef Humlíček, Arnulf Röseler, Thomas Zettler, Maria G. Kekoua, and Elza V. Khoutsishvili  »View Author Affiliations


Applied Optics, Vol. 31, Issue 1, pp. 90-94 (1992)
http://dx.doi.org/10.1364/AO.31.000090


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Abstract

The relationship between infrared refractive index and near-infrared, visible, and ultraviolet absorption spectra is examined. The long-wavelength limit and dispersion are determined as simple functions of composition. The computed results are compared with infrared ellipsometric measurements.

© 1992 Optical Society of America

History
Original Manuscript: June 6, 1990
Published: January 1, 1992

Citation
Josef Humlíček, Arnulf Röseler, Thomas Zettler, Maria G. Kekoua, and Elza V. Khoutsishvili, "Infrared refractive index of germanium–silicon alloy crystals," Appl. Opt. 31, 90-94 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-1-90


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References

  1. R. F. Potter, “Germanium,” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, New York, 1985), pp. 465–478.
  2. D. F. Edwards, “Silicon,” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, New York, 1985), pp. 547–569. ibid., pp. 547–569.
  3. J. J. Miceli, D. P. Naughton, “Model for gradient formation in polycrystalline germanium-silicon alloy GRIN crystals via Czochralski crystal growing,” Appl. Opt. 27, 500–504 (1988). [CrossRef] [PubMed]
  4. D. P. Naughton, J. J. Miceli, D. T. Moore, “Measurement of the refractive-index profile in polycrystalline germanium-silicon alloy GRIN crystals,” Appl. Opt. 27, 505–507 (1988). [CrossRef] [PubMed]
  5. J. Humlíček, M. Garriga, M. I. Alonso, M. Cardona, “Optical spectra of SxGe1−x alloys,” J. Appl. Phys. 65, 2827–2832 (1989). [CrossRef]
  6. A. Röseler, “Spectroscopic infrared-ellipsometry with the Fourier-transform-spectrometer,” preprint 85-4 (Zentralinstitut Optik und Spektroskopie, Berlin, Germany, 1985); A. Röseler, “Spectroscopic infrared ellipsometry by means of FTS,” Microchim. Acta 11, 79–83 (1988).
  7. R. Braunstein, A. R. Moore, F. Herman, “Optical absorption in germanium-silicon alloys,” Phys. Rev. 109, 695–710 (1958). [CrossRef]
  8. R. Braunstein, “Lattice vibration spectra of germanium-silicon alloys,” Phys. Rev. 130, 879–887 (1963). [CrossRef]
  9. A. E. Cosand, W. G. Spitzer, “Infrared absorption of lattice modes and the silicon local mode in GexSi1−x alloys,” J. Appl. Phys. 42, 5241–5249 (1971). [CrossRef]
  10. J. Humlíček, K. Vojtčchovský, “Infrared optical constants of intrinsic silicon,” Phys. Status Solidi A 92, 249–255 (1985). [CrossRef]

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