OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 11 — Apr. 10, 1992
  • pp: 1803–1809

Thickness measurement for volume holograms by analysis of first-order diffraction

J. Harthong and A. Medjahed  »View Author Affiliations


Applied Optics, Vol. 31, Issue 11, pp. 1803-1809 (1992)
http://dx.doi.org/10.1364/AO.31.001803


View Full Text Article

Enhanced HTML    Acrobat PDF (1243 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We present a method for measuring the thickness of volume holograms by analyzing the variations of the diffraction efficiency as a function of angle of incidence. This method can be justified theoretically within the Born approximation for gratings with small modulation. But we prove experimentally that the method can work surprisingly well even for strongly modulated volume holograms. The principle of the method consists of the determination of angles of incidence for which the first-order diffraction efficiency takes its extreme (maxima and minima) values: these angles are related to the thickness of the grating.

© 1992 Optical Society of America

History
Original Manuscript: December 29, 1989
Published: April 10, 1992

Citation
J. Harthong and A. Medjahed, "Thickness measurement for volume holograms by analysis of first-order diffraction," Appl. Opt. 31, 1803-1809 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-11-1803


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. D. Gabor, G. W. Stroke, “The theory of deep holograms,” Proc. R. Soc. London Ser. A 304, 275–289 (1968). [CrossRef]
  2. J. G. van der Corput, “Zur Methode der Stationären Phase I,” Compositio Math. 1, 15–38 (1936); “Zur Methode der Stationären Phase II,” Compositio Math. 3, 328–372 (1936).
  3. L. Solymar, D. J. Cooke, Volume Holography and Volume Gratings (Academic, New York, 1981).
  4. E. A. de Oliveira, J. Frejlich, “Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer,” Appl. Opt. 28, 1382–1386 (1989). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2 Fig. 3
 
Fig. 4 Fig. 5
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited