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Applied Optics

Applied Optics


  • Vol. 31, Iss. 11 — Apr. 10, 1992
  • pp: 1803–1809

Thickness measurement for volume holograms by analysis of first-order diffraction

J. Harthong and A. Medjahed  »View Author Affiliations

Applied Optics, Vol. 31, Issue 11, pp. 1803-1809 (1992)

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We present a method for measuring the thickness of volume holograms by analyzing the variations of the diffraction efficiency as a function of angle of incidence. This method can be justified theoretically within the Born approximation for gratings with small modulation. But we prove experimentally that the method can work surprisingly well even for strongly modulated volume holograms. The principle of the method consists of the determination of angles of incidence for which the first-order diffraction efficiency takes its extreme (maxima and minima) values: these angles are related to the thickness of the grating.

© 1992 Optical Society of America

Original Manuscript: December 29, 1989
Published: April 10, 1992

J. Harthong and A. Medjahed, "Thickness measurement for volume holograms by analysis of first-order diffraction," Appl. Opt. 31, 1803-1809 (1992)

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  1. D. Gabor, G. W. Stroke, “The theory of deep holograms,” Proc. R. Soc. London Ser. A 304, 275–289 (1968). [CrossRef]
  2. J. G. van der Corput, “Zur Methode der Stationären Phase I,” Compositio Math. 1, 15–38 (1936); “Zur Methode der Stationären Phase II,” Compositio Math. 3, 328–372 (1936).
  3. L. Solymar, D. J. Cooke, Volume Holography and Volume Gratings (Academic, New York, 1981).
  4. E. A. de Oliveira, J. Frejlich, “Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer,” Appl. Opt. 28, 1382–1386 (1989). [CrossRef] [PubMed]

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