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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 12 — Apr. 20, 1992
  • pp: 2066–2071

Characterization of the accretion of material by microparticles using resonant ellipsometry

Lorcan M. Folan  »View Author Affiliations


Applied Optics, Vol. 31, Issue 12, pp. 2066-2071 (1992)
http://dx.doi.org/10.1364/AO.31.002066


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Abstract

An optical technique to characterize the accretion of material by microparticles is described. Experiments on the absorption of water vapor by single levitated polystyrene microparticles are reported as examples of an application of the technique. The optical resonant frequencies of the microparticles are perturbed by the accretion of material and the observed shifts are used to characterize the growth. This technique, resonant ellipsometry, makes use of the polarization character of optical resonant modes to distinguish particle swelling from surface layer formation. The experimental results indicate that water vapor absorbed by polystyrene microparticles diffuses primarily into the particle bulk.

© 1992 Optical Society of America

History
Original Manuscript: December 3, 1990
Published: April 20, 1992

Citation
Lorcan M. Folan, "Characterization of the accretion of material by microparticles using resonant ellipsometry," Appl. Opt. 31, 2066-2071 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-12-2066


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References

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  16. These expressions differ slightly from those in Ref. 15. To be consistent with the definitions of Ref. 9, a factor of -m2, which appears in both the numerator and denominator of the coefficients in Ref. 15, was divided out. The equivalent expression for DnL in Ref. 15 [Eq. (40)] contains m2, multiplying only the homogeneous term and not the first-order correction, which we suspect is a typographic error.
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