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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 22 — Aug. 1, 1992
  • pp: 4563–4568

Polarization contrast in near-field scanning optical microscopy

E. Betzig, J. K. Trautman, J. S. Weiner, T. D. Harris, and R. Wolfe  »View Author Affiliations


Applied Optics, Vol. 31, Issue 22, pp. 4563-4568 (1992)
http://dx.doi.org/10.1364/AO.31.004563


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Abstract

Recent advances in probe design have led to enhanced resolution (currently as significant as ~ 12 nm) in optical microscopes based on near-field imaging. We demonstrate that the polarization of emitted and detected light in such microscopes can be manipulated sensitively to generate contrast. We show that the contrast on certain patterns is consistent with a simple interpretation of the requisite boundary conditions, whereas in other cases a more complicated interaction between the probe and the sample is involved. Finally application of the technique to near-filed magneto-optic imaging is demonstrated.

© 1992 Optical Society of America

History
Original Manuscript: August 13, 1991
Published: August 1, 1992

Citation
E. Betzig, J. K. Trautman, J. S. Weiner, T. D. Harris, and R. Wolfe, "Polarization contrast in near-field scanning optical microscopy," Appl. Opt. 31, 4563-4568 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-22-4563

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