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Applied Optics

Applied Optics


  • Vol. 31, Iss. 30 — Oct. 20, 1992
  • pp: 6371–6375

Line focusing in micro-Raman spectroscopy

M. Ivanda and K. Furić  »View Author Affiliations

Applied Optics, Vol. 31, Issue 30, pp. 6371-6375 (1992)

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In a microscope of a micro-Raman spectrometer a cylindrical lens is introduced to form a line-focus microprobe (LFMP). The dimensions of the LFMP are 0.66 × 167 μm. The lateral spatial resolution of Raman scattering with the LFMP is equal to the spatial resolution of the point-focus microprobe (PFMP). It is shown that the LFMP system enables measurements with a laser power density that is 320 times lower than the PFMP. For the same laser power density in both types of illumination, the LFMP Raman spectra give approximately 320 or ≈ 18 times better signal-to-noise ratio.

© 1992 Optical Society of America

Original Manuscript: May 20, 1991
Published: October 20, 1992

M. Ivanda and K. Furić, "Line focusing in micro-Raman spectroscopy," Appl. Opt. 31, 6371-6375 (1992)

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  1. G. J. Rosasco, E. S. Etz, W. A. Cassatt, “Investigation of Raman spectra of individual micrometer-size particles,” presented at the Fourth International Conference on Raman Spectroscopy, Brunswick, Maine, August 1974.
  2. G. J. Rosasco, E. S. Etz, W. A. Cassatt, “The analysis of discrete fine particles by Raman spectroscopy,” Appl. Spectrosc. 29, 396–404 (1975). [CrossRef]
  3. M. Delhaye, P. Dhamelincourt, “Raman microprobe and microscope with laser excitation,” J. Raman Spectrosc. 3, 33–43 (1975). [CrossRef]
  4. G. J. Rosasco, “Raman microprobe spectroscopy” in Advances in Infrared and Raman Spectroscopy, R. J. H. Clark, R. E. Hester, eds. (Heyden, New York, 1980), Vol. 7, pp. 223–282.
  5. P. M. Fauchet, “The Raman microprobe: a quantitative analytical tool to characterize laser-processed semiconductors,” IEEE Circuits Devices Mag. 2, 37–53 (1986). [CrossRef]
  6. R. K. Janssen, D. M. Krol, “Micro-Raman spectroscopy: a technique for analyzing bubbles in glass,” Appl. Opt. 24, 275–279 (1985). [CrossRef] [PubMed]
  7. H. Morishita, T. Ishida, M. Kobayashi, K. Sato, “Study of micropolytype structures in crystals of steraic acid B form by the Raman microprobe technique,” J. Phys. Chem. 91, 2273–2278 (1987). [CrossRef]
  8. B. Wopenka, J. D. Pasreris, “Limitations to quantitative analysis of fluid inclusions in geological samples by laser Raman microprobe spectroscopy,” Appl. Spectrosc. 40, 144–151 (1986). [CrossRef]
  9. C. Ballan-Dufrancais, M. Truchet, P. Dhamelincourt, “Interest of Raman laser microprobe (MOLE) for the identification of purinic concretions in histological sections,” Biol. Cellulaire 36, 51–58 (1979).
  10. W. Keifer, “New Raman techniques,” in the Fourth International Conference on Raman Spectroscopy, Brunswick, Maine, August 1974.
  11. W. Keifer, “Recent techniques in Raman spectroscopy” in Advances in Infrared and Raman Spectroscopy, R. J. H. Clark, R. E. Hester, eds. (Heyden, New York, 1977), Vol. 3, pp. 1–42.
  12. H. H. Eysel, S. Sunder, “Line focus method for recording laser Raman spectra of colored solids,” Appl. Spectrosc. 34, 89–90 (1980). [CrossRef]
  13. M. Bowden, D. J. Gardiner, G. Rice, “Line-scanned micro-Raman spectroscopy using a cooled CCD imaging detector,” J. Raman Spectrosc. 21, 37–41 (1990). [CrossRef]
  14. M. Hercher, W. Mueller, S. Klainer, R. F. Adamowicz, R. E. Meyers, S. E. Schwartz, “An efficient intracavity laser Raman spectrometer,” Appl. Spectrosc. 32, 298–302 (1978). [CrossRef]
  15. F. Cerdeira, M. Cardona, “Effect of carrier concentration on the Raman frequencies of Si and Ge,” Phys. Rev. B 5, 1440–1454 (1972). [CrossRef]
  16. F. Cerdeira, T. A. Fjeldly, M. Cardona, “Effect of free carriers on zone-center vibrational modes in heavily doped p-type Si. II. Optical modes,” Phys. Rev. B 8, 4734–4745 (1973). [CrossRef]
  17. T. R. Hart, R. L. Aggarwal, B. Lax, “Temperature dependence of Raman scattering in silicon,” Phys. Rev. B 1, 638–642 (1970). [CrossRef]
  18. J. J. Freeman, J. Heaviside, P. J. Hendra, J. Prior, E. S. Reid, “Raman spectrometry with high sensitivity,” Appl. Spectrosc. 35, 196–202 (1981). [CrossRef]

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