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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 30 — Oct. 20, 1992
  • pp: 6383–6388

Sampling jitter in Fourier-transform spectrometers: spectral broadening and noise effects

Roland Meynart  »View Author Affiliations


Applied Optics, Vol. 31, Issue 30, pp. 6383-6388 (1992)
http://dx.doi.org/10.1364/AO.31.006383


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Abstract

The effect of sampling jitter induced by frequency fluctuations of the reference laser is analyzed theoretically. It is shown that the spectral broadening of the lines is small enough to permit the use of single-mode laser diodes in medium-to-high-resolution spaceborne instruments. The same mathematical formalism is used to give a new insight into the analysis of the spectral noise induced by random sampling jitter caused by detector and electronic noise.

© 1992 Optical Society of America

History
Original Manuscript: December 10, 1991
Published: October 20, 1992

Citation
Roland Meynart, "Sampling jitter in Fourier-transform spectrometers: spectral broadening and noise effects," Appl. Opt. 31, 6383-6388 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-30-6383

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