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Applied Optics

Applied Optics


  • Vol. 31, Iss. 30 — Oct. 20, 1992
  • pp: 6383–6388

Sampling jitter in Fourier-transform spectrometers: spectral broadening and noise effects

Roland Meynart  »View Author Affiliations

Applied Optics, Vol. 31, Issue 30, pp. 6383-6388 (1992)

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The effect of sampling jitter induced by frequency fluctuations of the reference laser is analyzed theoretically. It is shown that the spectral broadening of the lines is small enough to permit the use of single-mode laser diodes in medium-to-high-resolution spaceborne instruments. The same mathematical formalism is used to give a new insight into the analysis of the spectral noise induced by random sampling jitter caused by detector and electronic noise.

© 1992 Optical Society of America

Original Manuscript: December 10, 1991
Published: October 20, 1992

Roland Meynart, "Sampling jitter in Fourier-transform spectrometers: spectral broadening and noise effects," Appl. Opt. 31, 6383-6388 (1992)

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  1. H. Sakai, “Consideration of the signal-to-noise-ratio in Fourier spectroscopy,” in Proceedings of Aspen International Conference on Fourier Spectroscopy (Air Force Cambridge Research Laboratories, Bedford, Mass., 1971), pp. 19–41.
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  8. Note that the calculation of Eq. (13) with the power spectral density of Eq. (20) leads to a result that is slightly different from Eq. (7.143) of Ref. 7.
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  10. It is assumed that the sampling pulses are generated at zero crossings of the laser interferogram. As a result, the SNR is defined by SNR = −20 log[sin(2πδx/λr)].

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