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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 34 — Dec. 1, 1992
  • pp: 7198–7213

Modulation transfer function measurement technique for small-pixel detectors

Mike Marchywka and Dennis G. Socker  »View Author Affiliations


Applied Optics, Vol. 31, Issue 34, pp. 7198-7213 (1992)
http://dx.doi.org/10.1364/AO.31.007198


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Abstract

A modulation transfer function (MTF) measurement technique suitable for large-format, small-pixel detector characterization has been investigated. A volume interference grating is used as a test image instead of the bar or sine wave target images normally used. This technique permits a high-contrast, large-area, sinusoidal intensity distribution to illuminate the device being tested, avoiding the need to deconvolve raw data with imaging system characteristics. A high-confidence MTF result at spatial frequencies near 200 cycles/mm is obtained. We present results at several visible light wavelengths with a 6.8-μm-pixel CCD. Pixel response functions are derived from the MTF results.

© 1992 Optical Society of America

History
Original Manuscript: December 13, 1991
Published: December 1, 1992

Citation
Mike Marchywka and Dennis G. Socker, "Modulation transfer function measurement technique for small-pixel detectors," Appl. Opt. 31, 7198-7213 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-34-7198

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