A method is proposed in which the responsivity (A/Im) for the photometric quantity of a silicon photodiode, which is combined with a V(λ) filter of a known spectral transmittance, can be directly self-calibrated by measuring the surface reflectance and the recombination losses of the photodiode for white light. The derived equation for this method assumes approximations that can cause systematic errors. A computer simulation was made to quantify these errors, and an accuracy of better than 0.2% was predicted. Although experimental validation is necessary, this method is promising as a new, practical method for high-accuracy photometric standards.
© 1992 Optical Society of America
Y. Ohno, "Silicon photodiode self-calibration using white light for photometric standards: theoretical analysis," Appl. Opt. 31, 466-470 (1992)