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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 4 — Feb. 1, 1992
  • pp: 466–470

Silicon photodiode self-calibration using white light for photometric standards: theoretical analysis

Y. Ohno  »View Author Affiliations


Applied Optics, Vol. 31, Issue 4, pp. 466-470 (1992)
http://dx.doi.org/10.1364/AO.31.000466


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Abstract

A method is proposed in which the responsivity (A/lm) for the photometric quantity of a silicon photodiode, which is combined with a V(λ) filter of a known spectral transmittance, can be directly self-calibrated by measuring the surface reflectance and the recombination losses of the photodiode for white light. The derived equation for this method assumes approximations that can cause systematic errors. A computer simulation was made to quantify these errors, and an accuracy of better than 0.2% was predicted. Although experimental validation is necessary, this method is promising as a new, practical method for high-accuracy photometric standards.

© 1992 Optical Society of America

History
Original Manuscript: October 24, 1990
Published: February 1, 1992

Citation
Y. Ohno, "Silicon photodiode self-calibration using white light for photometric standards: theoretical analysis," Appl. Opt. 31, 466-470 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-4-466

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