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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 31, Iss. 4 — Feb. 1, 1992
  • pp: 488–496

Fringe localization control in holographic interferometry

J. Blanco-García, J. L. Fernández, and M. Pérez-Amor  »View Author Affiliations


Applied Optics, Vol. 31, Issue 4, pp. 488-496 (1992)
http://dx.doi.org/10.1364/AO.31.000488


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Abstract

The practical use of holographic interferometry in nondestructive testing leads to many situations in which the characteristics of the fringe patterns make the observation and subsequent interpretation of the fringes difficult. Fringe control may then be employed to correct the troublesome parameters, the most commonly treated of which is fringe spacing. To gain more powerful control, a novel method is presented here that also permits one to change the localization of the fringe pattern. General vectorial expressions are derived that relate a tilt in the reference beam to a change in the fringe localization. Moreover the changes introduced into the fringe vector by this tilt can be suppressed by an adequate shift of the illumination beam focus. Some illustrative examples for a plane object are presented.

© 1992 Optical Society of America

History
Original Manuscript: June 25, 1990
Published: February 1, 1992

Citation
J. Blanco-García, J. L. Fernández, and M. Pérez-Amor, "Fringe localization control in holographic interferometry," Appl. Opt. 31, 488-496 (1992)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-31-4-488


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References

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