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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 32, Iss. 13 — May. 1, 1993
  • pp: 2224–2234

Index of refraction measurement on sapphire at low temperatures and visible wavelengths

A. C. DeFranzo and B. G. Pazol  »View Author Affiliations


Applied Optics, Vol. 32, Issue 13, pp. 2224-2234 (1993)
http://dx.doi.org/10.1364/AO.32.002224


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Abstract

The ordinary and extraordinary refractive index of two samples of sapphire, which differed in the way each was grown, was measured. The measurements were made over a wavelength range of 477–701 nm and a temperature range of 20–295 K. A three-term Sellmeier dispersion equation was fit to the data to permit refractive-index interpolation within several parts in 104. The data of index versus temperature were fit to a model and the results of dn/dT versus temperature are given along with certain physical constants that were extracted from the model.

© 1993 Optical Society of America

History
Original Manuscript: March 3, 1992
Published: May 1, 1993

Citation
A. C. DeFranzo and B. G. Pazol, "Index of refraction measurement on sapphire at low temperatures and visible wavelengths," Appl. Opt. 32, 2224-2234 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-13-2224

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